M31 memory compilers are designed with high industrial standards to which provides the memory solutions for density, power, and performance optimizations. M31 memory compilers are using leveraging industry-leading techniques to help customers to achieve their various SoC projects.
Meanwhile, M31 memory compiler IP was certified with ASIL-D of ISO 26262 in April, 2019.
Compiler Types
Compiler type |
Features |
Bit-cell |
Synchronous Write-through |
Power-gating |
Scan; BIST interface |
High density SP-SRAM |
|
High density bit cell (HD-6T) |
Y / N |
Y / N |
Y / N |
High speed SP-SRAM |
|
High current bit-cell (HC-6T) |
Y / N |
Y / N |
Y / N |
1P register file |
|
HC-6T or HD-6T |
Y / N |
Y / N |
Y / N |
2P register file |
|
2-Port bit-cell (8T) |
Y / N |
Y / N |
Y / N |
Ultra-high density 2P |
|
High current bit-cell (HC-6T) |
Y / N |
Y / N |
Y / N |
DP-SRAM |
|
Dual-port bit-cell (DP-8T) |
Y / N |
Y / N |
Y / N |
ROM |
|
VIA |
N |
N |
N |
Cache instance |
|
High current bit-cell (HC-6T) |
Y / N |
N |
Y / N |
Instance Types
Product |
Features |
IP |
Big Macro |
|
2Mb, 4Mb |
Wide range VDD operation Memory |
|
SP-SRAM, 1PRF, 2PRF, ROM |
Optimized PPA (OPPA) |
|
Cache instances |
- IP Product Lists
- Features
- High-sigma design for yield and performance optimization
- Ultra-high-speed techniques for Cache implementation
- Ultra-low-power circuits for mobile and AIoT devices
- Ultra-high-density memory design for consumer solutions
- Provides multi-port memory design for different processors application
- Apply the Dynamic Voltage/Frequency scaling (DVFS) technique for users with multi-VDD domain
- Specific option pins for dynamic/standby power gating
- Porosity top metal lines structure to improve customer’s chip routability
- Synchronous read/write operations
- Different VT of periphery devices options
- Flexible bank structure for performance and power optimization
- Specialty power gating for performance and power optimization
- Separate dual rail design of VCCA(array) and VCCP(periphery)
- Separate read/write margin for sigma coverage design
- Separate read/write-assist strength for different accumulated density applications
- BIST [ON/OFF]; Scan [ON/OFF];
- Provides row/col-redundancy [ON/OFF]Different VT of periphery devices options